© 2013 atmel 1 sam d21 peripheral touch controller noise immunity

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© 2013 Atmel 1 SAM D21 Peripheral Touch Controller Noise Immunity

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© 2013 Atmel1

SAM D21 Peripheral Touch Controller

Noise Immunity

2 © 2013 Atmel

• Impact of noise on a touch application• Noise sources• Noise immunity standard

• Peripheral Touch Controller noise immunity features• Pre-processing and post-processing features

• Serial Resistor (Rs)• Detect Integration (DI)

• Acquisition Features• Filter_Level• Auto Oversampling (Auto_OS)• Frequency Hopping

• Video : 10VCI Bench

• Conclusion

Presentation Outline

3 © 2013 Atmel

Impact of noise on a Touch application

4 © 2013 Atmel

Radiated NoiseDefinition

Radiated noise correspond to unwanted ’noisy’ RF voltages emitted by external element from the system.

Fluorescent lamp

Induction plate

5 © 2013 Atmel

Radiated noiseImpact on touch application

Lamp impact

6 © 2013 Atmel

Conducted noise definition Impact on touch application

EARTH

Without noise

With radiated noise

No touch Touch

Noise always present in the system

7 © 2013 Atmel

Conducted noiseDefinition

Conducted noise correspond to unwanted ’noisy’ RF voltages and currents carried by its external wires and cables. Common mode noise

8 © 2013 Copyright Atmel Corporation

Conducted noiseImpact on touch application

Noisy Power supply (3.3V)

Not tuned board

9 © 2013 Copyright Atmel Corporation

Conducted noise definition Impact on touch application

EARTH

Without noise

With conducted noise

No touch Touch

power supply lines maintain a stabledifference between VDD and GND

user’s finger now provides a returnpath and effectively couples noise directly

into the capacitive sensor

10 © 2013 Copyright Atmel Corporation

• Define Common reference and a set of testing methods• Modulated RF signal stepped over the frequency range from 150kHz to

80MHz. • At each step there is a ’dwell period’ whilst the EUT (Equipment Under

Test) is checked for performance degradation.

• Result classifications :

• Class A – No significant degradation.• Class B – Degradation in operation but the product fully recovers once the stress

is removed without any operator intervention. (no loss of data)• Class C – Operation is affected and operator intervention is required (no loss of

data)• Class D – Unrecoverable loss of function or degradation of performance. Loss of

data may occur.

Noise immunityInternational Standard IEC/EN 61000-4-6

11 © 2013 Copyright Atmel Corporation

PTC noise immunity features

12 © 2013 Copyright Atmel Corporation

• Manage by combination of hardware acquisition features and software post acquisition treatment .

• Fast and easy Tuning is possible using dedicated Library parameters

PTC noise immunity featuresPTC acquisition/ software features

100K 16

IRQAcquisitionModule• Sensitivity ctrl• ADC• Oversampling

RS

CompensationCircuit

X Line Driver

Input control

Y0

Y1

Y15

Result

X0

X1

X15

QTouch Library

• Set RSEL_VAL• Set DI• Set Filter_Level• Set Auto_OS • Set Frequency_Mode

API

13 © 2013 Copyright Atmel Corporation

PTC noise immunity featuresPost-processing and pre-processing features

14 © 2013 Copyright Atmel Corporation

• Increasing the impedance of the signal path can significantly improve immunity to conducted noise while maintaining the overall signal integrity.

• Intermediate resistor value can be chosen to achieve the required level of noise suppression while meeting other system design requirements such as power consumption and response time.

PTC noise immunity featuresSerial Resistor (RSEL_VAL_x)

1-100k

AcquisitionModule• Sensitivity ctrl• ADC• Oversampling

RS

CompensationCircuit

X Line Driver

Input control

Y0

Y1

Y15

X0

X1

X15

15 © 2013 Copyright Atmel Corporation

• Principle : Post processing Filter that requires several consecutive measurements to confirm touch/Release (Similar to debounce system)

• Example DI = 3 :

• DI Limit range • A DI count of 3 is the minimum practical setting • A DI count of 6 is common • Higher values : better noise immunity, slower response

PTC noise immunity featuresDetect Integration (DI)

No touch reported

No touch reported

Touch reported

No Touch reported

16 © 2013 Atmel

Illustration : 10CI Bench Video

17 © 2013 Atmel

Illustration : 10CI Bench VideoBench description

Application to test

Test Software

Coupling / decoupling network

Power amplifier

10cm standoff

from earth plane

CI Signal Generator

18 © 2013 Atmel

Illustration : 10CI Bench Video Test 1 : Test Application without noise • Configuration : Filter_Level = 4

• Result: Good and fast operation

19 © 2013 Atmel

• Configuration : frequency = 150kHz , Filter_Level = 4

• Result: Shows false detects and failures.

Illustration : 10CI Bench VideoTest 2 : First frequency of standard CI sweep (150kHz)

20 © 2013 Atmel

• Configuration : Frequency = 150kHz, Rs = 100k, Filter_Level = 32

• Result: Works very well

Illustration : 10CI Bench VideoTest 3 : First frequency of standard CI sweep (150kHz)

21 © 2013 Copyright Atmel Corporation

Illustration : 10CI Bench VideoTest 5 : Test frequency = 265kHz

• Configuration : frequency = 256kHz, Rs = 100k, Filter_Level = 32

• Result: Shows false detects, failures

22 © 2013 Copyright Atmel Corporation

Illustration : 10CI Bench VideoTest 5 : Test frequency = 265kHz

• Configuration : Frequency = 256kHz , Rs = 100k , Filter_Level = 64, Auto_OS = 8

• Result: Works very well

23 © 2013 Copyright Atmel Corporation

Illustration : 10CI Bench VideoTest 6 : Test frequency = 267kHz (Harmonic Close to Oversampling 266.67kHz)

• Configuration : Frequency = 267kHz , Rs = 100k , Filter_Level = 64, Auto_OS = 8

• Result: Shows flickering on both keys and slider LEDs

24 © 2013 Copyright Atmel Corporation

Illustration : 10CI Bench VideoTest 7 : Test frequency = 267kHz (Harmonic Close to Oversampling 266.67kHz)

• Configuration : Frequency = 267kHz , Rs = 100k , Filter_Level = 64, Auto_OS = 8 Frequency hopping enabled

• Result: Works very well

25 © 2013 Copyright Atmel Corporation

• When dealing with noise immunity, It is important to understand the environment in which the touch application is designed to operate in, and where appropriately apply suitable techniques to address the effects of unwanted noise disturbances.

• The Peripheral touch controller embed in SAM D21 and associated Software Library provide key features for building suitable touch application with techniques to overcome noise disturbance .

03/04/2013Introducing Atmel SAM D20 Flash MCUs

Conclusion