high aspect ratio deep etching in gainassb/algaassb system ... · gas : sf6, o2, cl2, ar, n2 rf...

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HAL Id: hal-01102388 https://hal.archives-ouvertes.fr/hal-01102388 Submitted on 12 Jan 2015 HAL is a multi-disciplinary open access archive for the deposit and dissemination of sci- entific research documents, whether they are pub- lished or not. The documents may come from teaching and research institutions in France or abroad, or from public or private research centers. L’archive ouverte pluridisciplinaire HAL, est destinée au dépôt et à la diffusion de documents scientifiques de niveau recherche, publiés ou non, émanant des établissements d’enseignement et de recherche français ou étrangers, des laboratoires publics ou privés. High aspect ratio deep etching in GaInAsSb/AlGaAsSb system by ICP-RIE plasma Brice Adelin, Alexandre Larrue, Aurélie Lecestre, Pascal Dubreuil, Yves Rouillard, Guilhem Boissier, Aurore Vicet, Antoine Monmayrant, Olivier Gauthier-Lafaye To cite this version: Brice Adelin, Alexandre Larrue, Aurélie Lecestre, Pascal Dubreuil, Yves Rouillard, et al.. High aspect ratio deep etching in GaInAsSb/AlGaAsSb system by ICP-RIE plasma. Plasma Etch and Strip in Microtechnology ( PESM ) 2014, May 2014, Grenoble, France. hal-01102388

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Page 1: High aspect ratio deep etching in GaInAsSb/AlGaAsSb system ... · Gas : SF6, O2, Cl2, Ar, N2 RF plasma powers (13.56 MHz) : PICP < 600 W Pbias < 100 W 2 mTorr < Pr < 50 mTorr Etching

HAL Id: hal-01102388https://hal.archives-ouvertes.fr/hal-01102388

Submitted on 12 Jan 2015

HAL is a multi-disciplinary open accessarchive for the deposit and dissemination of sci-entific research documents, whether they are pub-lished or not. The documents may come fromteaching and research institutions in France orabroad, or from public or private research centers.

L’archive ouverte pluridisciplinaire HAL, estdestinée au dépôt et à la diffusion de documentsscientifiques de niveau recherche, publiés ou non,émanant des établissements d’enseignement et derecherche français ou étrangers, des laboratoirespublics ou privés.

High aspect ratio deep etching in GaInAsSb/AlGaAsSbsystem by ICP-RIE plasma

Brice Adelin, Alexandre Larrue, Aurélie Lecestre, Pascal Dubreuil, YvesRouillard, Guilhem Boissier, Aurore Vicet, Antoine Monmayrant, Olivier

Gauthier-Lafaye

To cite this version:Brice Adelin, Alexandre Larrue, Aurélie Lecestre, Pascal Dubreuil, Yves Rouillard, et al.. High aspectratio deep etching in GaInAsSb/AlGaAsSb system by ICP-RIE plasma. Plasma Etch and Strip inMicrotechnology ( PESM ) 2014, May 2014, Grenoble, France. �hal-01102388�

Page 2: High aspect ratio deep etching in GaInAsSb/AlGaAsSb system ... · Gas : SF6, O2, Cl2, Ar, N2 RF plasma powers (13.56 MHz) : PICP < 600 W Pbias < 100 W 2 mTorr < Pr < 50 mTorr Etching

High aspect ratio deep etching in GaInAsSb/AlGaAsSb system by ICP-RIE

plasma B. Adelina,b,*, A. Larruea,b, A. Lecestrea,b, P. Dubreuila,b, Y. Rouillardc, G. Boissierc, A. Vicetc , A. Monmayranta,b, and

O. Gauthier-Lafayea,b

aLAAS-CNRS, 7 avenue du Colonel Roche, BP 54200, 31031 Toulouse cedex 4, France bUniversité de Toulouse ; UPS, INSA, INP, ISAE ; LAAS ; BP 54200, 31031 Toulouse cedex 4, France

c Institut d’Electronique du Sud (IES), Université Montpellier 2, Place Eugene Bataillon, 34095 Montpellier, France

Context

5 4.5 4 3.5 3 2.5 2

1E-18

1E-20

1E-22

1E-24

g (µ )

H2O CO2

Target

Mid infrared tunable diode laser spectroscopy

for trace gas detection in the 2-5µm wavelength

range.

-15

-10

-5

0

5

10

15

0 2 4 6 8 10 12

Emis

sio

n W

ave

len

gth

/ A

bso

rpti

on

lin

e (

nm

)

Laser number

Laser 1

Laser 2

Laser 3

Laser 4

Laser 5

Laser 6

Laser 7

Laser 8

Laser 9

Laser 10

Laser 11

Principle of the spectroscopy using an array of

single frequency lasers and tunable over a small

wavelength range

Issue

Figure 1. Absorption lines strength from 2 to 5 µm.

(HITRAN 96 database[1])

Towards the realization of laser diodes all PhC

electrically pumped in GaSb system

Heterostructure AlGaAsSb / InGaAsSb for an emission

around 2.3μm

Etching of submicron patterns with high aspect ratio in

the heterostructure :

Characteristic dimensions : Ø ~ 375 nm,

H ~ 3.5 µm

Aspect ratio : 1:9

Previous work

Masking strategy adopted

Tri-layer mask used to open the

submicron patterns in III-V substrate

SiO2 200 nm

Substrat/Heterostructure III-V

SiO2 400nm

Cr 50 nm

Photonic Crystals FIB cut

after complete transfer in the

mask

Development of a multi-step etching process combining

Cl2/N2, O2 and N2 ICP plasma etching

1,45 µm

350 nm

Photonic crystals etched in

heterostructure

AlGaAsInSb/AlGaAsSb

Limits :

Verticality ⇒ angle of 7°

Depth = 1.45 µm ⇒ < 4 µm

Etched sidewalls ⇒ notching

Optimization of the process of chlorinated ICP-RIE etching III-V materials

Limit redeposition (verticality) : Adding Argon

Influence of ICP power : Influence of pressure :

Deep etching process optimized : Cl2/N2/Ar 45/15/5 sccm – 75 W ICP – 5.5 mTorr

Acknowledgments : This work was supported by the French National Research Agency (ANR) under Grant ANR-2011-NANO-028 01 (ANR MIDAS)

Conclusion

Establishment of a high aspect ratio deep etching process in

GaInAsSb/AlGaAsSb system

Improvement :

Verticality ⇒ angle of 2-3°

Etched sidewalls ⇒ less notching

Low roughness

Outlook :

Record high aspect ratio

Sensitivity to aluminum concentration

Profile improvement

System tool : SPTS ICP-RIE : Trikon-Omega201

Operating range :

Gas : SF6, O2, Cl2, Ar, N2

RF plasma powers (13.56

MHz) : PICP < 600 W

Pbias < 100 W

2 mTorr < Pr < 50 mTorr

Etching

process by

ICP-RIE

Mask

PMMA ZEP520A SiO2 Cr

GaAs by

Cl2/N2

0.5 0.7 4 16

SiO2 by

CHF3

< 0.5 0.5 - 50

« Masking strategy for all ICP-RIE etching of high aspect ratio Photonic Crystals in

GaAs » A. Larrue, and al. , JNTE (2008)

"Inductively coupled plasma etching of high aspect

ratio two-dimensional photonic crystals in Al-rich

AlGaAs and AlGaAsSb" A. Larrue, and al., JVSTB

Vol. 29(2), pp. 021006 (2011)

Approach

Array of 2nd-order DFB singlemode, all-

photonic-crystal (PhC) laser. We replace a laser

which would be tunable over a wide range of

wavelengths by an array of N lasers tunable over

a range of wavelengths N times smaller. We call

this method MTDLAS: multiplexed tunable

diode laser absorption spectroscopy.

Substrat/Heterostructure III-V

SiO2 400nm

Cr 50 nm

Successful insertion of

this technological step in

a complete process

Cl2/N2

etching

O2 oxydation N2

passivation

Repeated N times

H

Ø