i. milostnaya, a. korneev, m. tarkhov, a. divochiy, o. minaeva, v. seleznev, n. kaurova, b. voronov,...

4
I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman Moscow State Pedagogical University, Moscow 119992, Russia Overview Single Photon Superconducting Detectors (SSPDs) Developed in collaboration of the MSPU (Prof. Gregory Gol’tsman group) and University of Rochester (Prof. Roman Sobolewski group) 1-4 , fabricated at MSPU Based on superconducting nanowires made from ultra-thin superconducting films. Operation is based on photon-induced resistive hotspot formation in the current-carrying superconducting nanowire 2 . Operated at temperatures 2 - 4.2 K well below T c at a bias current I b close to I c . Capable of single photon counting in the VIS and IR waveranges. Further improvement of the SSPD performance in the IR and THz ranges is expected by implementation of superconducting materials with a lower Tc having a narrow energy gap. First MoRe SSPDs were fabricated and Superconducting Single Photon Nanowire Detectors Development for IR and THz applications State-of-the-art NbN SSPDs L08 At operational temperature 4 K 2 K Quantum Efficiency, % at VIS >10 >30 at NIR (1.3–1.55 μm) >6 > 20 at MIR (6 μm) ~0.5 Dark Counts, s -1 <1 <10 - 4 NEP, W/Hz 1/2 at VIS and NIR ~10 -17 ~10 -21 at MIR (5 μm) ~10 -18 Wavelength range, μm 0.5 - 6 Device performances 0.4 0.6 0.8 1 2 4 10 -5 10 -4 10 -3 10 -2 10 -1 10 0 10 1 10 2 T=5K Q E % T=3K QE 3K /QE 5K =200

Upload: vernon-reeves

Post on 17-Jan-2016

220 views

Category:

Documents


6 download

TRANSCRIPT

Page 1: I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman

I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman

Moscow State Pedagogical University, Moscow 119992, Russia

OverviewSingle Photon Superconducting Detectors (SSPDs)

● Developed in collaboration of the MSPU (Prof. Gregory Gol’tsman group) and University of Rochester (Prof. Roman Sobolewski group)1-4, fabricated at MSPU

● Based on superconducting nanowires made from ultra-thin superconducting films.

● Operation is based on photon-induced resistive hotspot formation in the current-carrying superconducting nanowire2.

● Operated at temperatures 2 - 4.2 K well below Tc at a bias current Ib close to Ic.

● Capable of single photon counting in the VIS and IR waveranges.

● Further improvement of the SSPD performance in the IR and THz ranges is expected by implementation of superconducting materials with a lower Tc having a narrow energy gap.

● First MoRe SSPDs were fabricated and tested.

Superconducting Single Photon Nanowire Detectors Development for IR and THz applications

State-of-the-art NbN SSPDs

L08

At operational temperature 4 K 2 KQuantum Efficiency, % at VIS >10 >30 at NIR (1.3–1.55 μm) >6 > 20 at MIR (6 μm) ~0.5Dark Counts, s-1 <1 <10- 4

NEP, W/Hz1/2

at VIS and NIR ~10-17 ~10-21

at MIR (5 μm) ~10-18

Wavelength range, μm 0.5 - 6

Device performances

0.4 0.6 0.8 1 2 4

10-5

10-4

10-3

10-2

10-1

100

101

102

T=5K

QE %

T=3K

QE3K/QE5K=200

Page 2: I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman

SSPDs Fabrication at MSPU

The mature technology is developed for NbN SSPDs. Deposition of 4-nm-thick NbN film on Sapphire substrate by DC magnetron sputtering of Nb target in in Ar+N2 mixture Patterning of stripe windows by direct e-beam lithography Formation of Au contacts by optical lithography Formation of meander-shaped structure with reactive ion etching

NbN films properties:• Thickness 4 nm• Critical temperature Tc=10-11K• Transition width Δ Tc=0.3K• Critical current density jc=7x106 A/cm2

’Standard’ Device Design• SSPDs are designed as meander-shaped nanowires connected to Au contact pads intended for connection to a coplanar waveguide.

• Drawback: response time is significantly affected by a nanowire kinetic inductance.

Response of a single 500-µm-long nanowire

SEM image of the 10 m x 10 m SSPD

Advanced SSPD Design• Multisection SSPDs with lower kinetic inductance are designed as several meander nanowires connected in parallel• Subnanosecond photoresponse time achieved

Oscillograms of the response for 2-section (a) and 5-section (b) SSPDs

• Meander size 10x10μm2

• Nanowire width 80 - 100 nm• Line pitch 200 nm• Nanowire length up to 500 μm

Page 3: I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman

MoRe SSPD

The use of a material with the narrow energy gap and low quasiparticles diffusivity should shift the detectors sensitivity towards longer wavelengths.

• Motivation.

• ‘Standard’ SSPD nanowire meander structures of good quality were fabricated and tested.

Ultrathin (4-10 nm thick) MoRe films were deposited by DC magnetron sputtering of a Mo60/Re40 target.

Oscillogram of the single-photon response of a 200-nm-wide MoRe nanowire

Dependence of a counting rate on a bias current

• First single-photon response was obtained for 1.26m photons at operational temperature of 4.2K.

• Technology of ultra-thin MoRe films suitable for SSPD was developed.

Best MoRe films properties: Thickness 4 nm 10 nm

Critical temperature Tc=7.7 K 9.7K

Transition width Δ Tc=0.1K 0.2K

Critical current density at 4.2K jc=1.1x106 A/cm2

Sheet resistance Rs=65-75 /□

5 6 7 8 90.0

0.2

0.4

0.6

0.8

1.0

R, a

.u.

T, K

4-nm thick MoRe film MoRe SSPD

Page 4: I. Milostnaya, A. Korneev, M. Tarkhov, A. Divochiy, O. Minaeva, V. Seleznev, N. Kaurova, B. Voronov, O. Okunev, G. Chulkova, K. Smirnov, and G. Gol’tsman

References

[1] G. Gol'tsman at al., Appl. Phys. Lett. 79 (2001), 705.

[2] A. Semenov at al., Physica C, 352 (2001), 349.

[3] G. Gol’tsman et al., IEEE Trans. on Appl. Supercond. 13(2) (2003), 192.

[4] A. Korneev et al., Appl. Phys. Lett. 84 (2004), 5338.

[5] A. Korneev et al., SPIE Europe Int. Congress on Optics and Optoelectronics, Prague,  Czech Republic, 16 - 19 April 2007.