Exercise taist ictes program vlsi design methodology hiroaki kunieda tokyo institute...

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Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

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Page 1: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

Exercise

TAIST ICTES ProgramVLSI Design Methodology

Hiroaki Kunieda

Tokyo Institute of Technology

Page 2: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

1.VLSI Overview1. Fabrication process such as CMOS process must be decided in prior to design. Describe the reason why ?2. The substrate of nMOS transistor must be connected to ground, while the substrate of pMOS transistor must be connected to VDD, power supply. Describe the reason why ?3. What decide the maximum LSI speed or clock frequency ?4. Describe the difference between Digital LSI and Analog LSI.5. What is the reason why LSI manufacturing requires volume production ?6. Why LSI costs are decided by chip area ?7. Why LSI reliability is much more than the discrete circuits ?8. Why place and rout affects the performance of LSI ?9. CMOS process is preferred to NMOS process or Bipolar process. Describe the reason.10. What is the role of the stray or parasitic capacitance ?

Page 3: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

2.VLSI Basic 1 [1] The nMOS pull down logic gates blocks are shown in the figure.1.Draw the complete CMOS circuit.2.Derive the logic function.3.Draw the stick diagram layout of the CMOS circuit.4.Draw the complete pseudo-NMOS circuit by adding a pMOS transistor.5.Draw the complete CMOS domino logic to achieve the same logic function.6.Derive the channel width and length of CMOS gate, which has the same characteristics in terms of rise and fall times as a CMOS inverter consisting of nMOS of W/L=250/25 and pMOS of W/L = 400/25. 

A

B

C

A

B

Page 4: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

2.VLSI Basic 2 [2] Figure shows Gate Array layout mask patterns, which consists of basic cells. Basic cell is a identical transistor cell. Gate Array employs only metal and its contact window masks over the pre-manufactured Transistor array. 1.Describe basic cell.2.Derive the circuit of the figure.3.Show the width and length of transistor used in the figure.4.Describe functional behavior of the circuit.5.This circuit is used as shown in figure. Describe the function of this circuit.

図1.1

Out_P

Out_N

Out_Buffer

data_input

input_Mode

Page 5: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

2.VLSI Basic 2

input_Mode

data_input

Out_N

Out_P

Page 6: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

Gate DelayCMOS Driver sends signal through wire to 10 CMOS Gates. Calculate gate delay of the driver without and with wire delays.

CMOS Inverter has On Resistance Ro/W and output and input capacitor CoW for channel width of W/25nm, where Ro is 200 Ωum, Co=50fF/um. VDD=1.0V, VT=0.4V

Wire unit resistance is Rline=500 Ω/mm 、 wire unit capacitor is Cline=300fF/mm.

Page 7: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

wire Delay

Page 8: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

3.Standard Cell Overview

Standard Cell Design has many advantages over another design. 1. Layout design can automatically be performed by CAD tool. Describe the reason. 2. Logic Synthesis can also be performed with excellent design compiler. In order to run logic synthesizer, what data of standard cells are needed ? 3. What is a major requirement for each standard cell ?

On the other hand, standard cell design is not optimal solution, in terms of design optimization. 1. Describe the reason why the designed schematic circuits are not optimal in terms of power, speed, and chip area. 2. Gate Array is a semi custom design so that wefa can be fabricated in prior to design requirement. Describe the reason why standard cell is not semi custom design in the same sense as Gate Array.

Page 9: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

4. Verilog HDL

Describe both data path and control circuit of Figure by VerilogHDL.After the starting signal S raises, the circuit of Figure accepts a sequence of input data and accumulates them.

Page 10: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

5. Logic Design

Consider logic function F=ab’cd+ab’e+b’d’e+f

1) Find out kernel and its cofactor of the logic function.2) Show the algebraic division by selecting one of kernels.3) Repeat until no further division is made.

Page 11: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

0 0 0 0 0

0 0 1 0 0

0 0 * 0 0

0 1 * 0 1

1 0 * 1 0

1 0 * 0 0

1 1 * 1 1

1 1 * 1 1

Q2 X

0

0

1

1

0

1

1

1

Q0 D1 YD0Q1

0

1

0

0

1

0

1

0

D2

0

0

1

1

1

0

1

0

0 1 * 0 0 100

D0 Q0

D1 Q1

CombinatorialLogicCircuit

Input X Output Y

Y0

Y1

Y2

Y3

X0

X1

X2

X3

D2 Q1

[1] Consider to design Standard Cell LSI for Figure 1. While, Table 1 shows the specification or the truth table of combinatorial circuit Fc, which is a subsystem of the state machine Sm as shown in Figure 1.

1. Describe the state transition graph of the state machine Sm.

2. Describe 4 outputs of the combinatorial circuit Fc by logic equations.

3. Derive kernels and their cofactors of each logic function of the combinatorial circuit Fc.

4. Do logic synthesis for the combinatorial circuit Fc and draw the logic circuit.

5. Suppose that we have only cells such as 3 input NAND, AND-OR-Inverters and so on in standard cell library. Please perform technology mapping for the logic circuit of the combinatorial circuit Fc.

5. Logic Design

Page 12: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

6. Describe VerilogHDL for this state machine Sm.7. Suppose that we do simulation of the state machine in

order to verify correctness of your VerilogHDL, Draw the timing chart of the machine Sm. Assume that clock frequency is 100MHz and gate delay of each cell is 3 nsec and FF works with no delay.

8. By deriving Binary Decision Diagram (BDD), perform formal verification for the derived logic circuit of the combinatorial circuit Fc as follows.

9. 5.1) Derive BDD from the truth table 1.10. 5.2) Derive BDD for 3input-NAND and AOI(AND-OR

Inverter) from the derive circuit of the combinatorial circuit Fc.

11. Describe scan path design for the state machine of Figure 1 and describe how to test the state machine with scan path.

12. Describe why this scan path design is necessary.

Page 13: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

6. Logic Verification

Perform formal verification of the above logic circuit using BDDRepresentation.

Page 14: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

Sum Generation Function

Page 15: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

Carry Generation Function

Page 16: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

Carry Generation Function

Page 17: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

D2

Q2'

Q0

X

D1

D0Q0'

Y

Q1'

7. Placement

2] Suppose that the derived circuit is shown as in Figure 2. Decide the placement of all gates in one row for the circuit by using the model of standard cells as shown in Fig.3.Do the interconnection between those gates. The number of horizontal tracks used in channel routing should be minimized.Describe the reason why, after layout, we should perform again timing analysis. Suppose that all gate delays are 1nsec and all wire delays are 1nsec. Calculate the total delays on critical path.

Page 18: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

7. Layout Design

Suppose that above graph represents connections between differentStandard cells placed in a row. Find out the best placement of thisStandard cells.

Page 19: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

7. Layout Design

13

1

2

9

9

10

1

7

5

13

2

10

5

3

7

5

0

6

3

4

11

3

6

8

4

11

11

12

8

0

12

8

Above figure shows routing channel with net number to be connected.Net 0 indicates no connection.(1)Try routing by left edge method.(2)Draw a restriction graph, whose node corresponds to net, and whose edge corresponds to the relationship of overlapping of area.

Page 20: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

Module Test(clock, X);Input clock, X; output Y;reg [1:0] current_state, next_state; parameter s0=2’b00, s1=2’b01, s2=2’b11, s3=2’b10;   always @(posedge clock)     current_state<=next_state;   always @(current_state or input)     begin

case(current_state) s0: next_state<=X?s1:s0; s1: next_state<=s2; s2: next_state<=s3; s3: next_state<=s0; default:next_state<=s0;endcase

     end   always @(current_state or X)     begin        case(current_state)        s0: Y <=0;        s1: Y <=0;        s2: Y <=0;        s3: Y <=1;        default:output<=0;     endcase endendmodule

1. Describe the state transition diagram

2. Obtain the state transition table with input (Q1, Q0, X) and output (D1, D0, Y), where (Q1, Q0) are corresponding to states s0-s3 and (D1, D0) are inputs of FFs for (Q1, Q0) respectively.

3. Obtain the logic functions D1, D0, and Y, respectively.

4. Describe the state machine by using the combinational logic block with input (Q1, Q0, X) and output (D1, D0, Y).

Page 21: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology
Page 22: Exercise TAIST ICTES Program VLSI Design Methodology Hiroaki Kunieda Tokyo Institute of Technology

[4] 2 D-FFs, OR-AND and AND standard cells are shown in Figure 2 with interconnection information. 1.Verify the net number on the terminal of 2 D-FFs and OR-AND and AND cells by showing the routing between those cells in an upper channel routing area. Suppose that the input comes from the left side and the out goes out to the right side in the routing channel.2.Place them in 1 dimensional row so as to minimize the number of tracks in routing channel. 3.Please explain what is the clock tree insertion and explain the reason why clock tree insertion should be conducted in between placement and routing procedure.4.Show the optimal routing in an upper channel area to realize the state machine.

D-FFD1Q1

Q1

Q1 Q1Q0

D-FFD0Q0

Q0

Q0D0 Q0 Q0X Q1D0 Q1Q0 Y