pixel production database status p. netchaeva - infn genova 13 february 2003

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Pixel Production Database Pixel Production Database STATUS STATUS P. Netchaeva - INFN Genova P. Netchaeva - INFN Genova 13 February 2003 13 February 2003

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Pixel Production Database STATUS P. Netchaeva - INFN Genova 13 February 2003. Sensors. PDB readiness : Item tables + java application for Wafer upload (with sub-structures) + Report with links to Items exist. Test tables (-last update) - PowerPoint PPT Presentation

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Page 1: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Production Database Pixel Production Database STATUSSTATUS

P. Netchaeva - INFN GenovaP. Netchaeva - INFN Genova13 February 200313 February 2003

Page 2: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 2

SensorsSensors

PDB readiness:

Item tables + java application for Wafer upload (with sub-structures) + Report with links to Items exist.Test tables (-last update) + java applications for upload data and download data file + Reports exist.

Missing: Last update of test tables.

Data:

236 wafers: 201 CiS and 35 Tesla are registered.121 wafers are with Visual inspection test results. 44 wafers are with Planarity test results. 24 wafers are with SCR test results. 0 wafers are with Thickness test results.

Tiles: 478 IV tested (of 708) 36 ITS tested

Page 3: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 3

ElectronicsElectronics

PDB readiness:

Item tables + java application for Wafer upload (with sub-structures) + Report with links to Items exist.

FE and MCC “colours” + java applications for their upload + Reports for colour representation of these Items exist.

Missing: New reticle layout will not change Item table, but will change java application for Wafer upload.

Test definitions, as a consequence:Tables + java applications + Reports for tests.

Data:

34 wafers with FEs and MCCs.

Page 4: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 4

Bare ModulesBare Modules

PDB readiness:

Item tables + java application for Tile + 16 FE assembling+ Report with links:

to Items,to Bare Module Assembly sub-Items with link to future tests,to X-ray test data

exist.

Missing:

Test definitions, as a consequence:Tables + java applications + Reports for tests.

Data:

33 Bare Modules.

Page 5: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 5

Flex ObjectsFlex Objects

PDB readiness:

Item tables + java applications for Flex+components, Flex+MCC assembling+ Report with links to Items exist.

Test tables + java application for upload + Reports exist.

Missing: Our Flex Items all are called “Prototypes”. The PDB Item structure for production Items does not exist.

Data:

166 FlexLoadedPrototype Items 46 FlexMCCPrototype Items.

Missing:Test data.

Page 6: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 6

Flex Objects: ModulesFlex Objects: ModulesPDB readiness:

The Modules are Flex Object Items, so as for Flex Objects:Item tables + java applications for Flex with MCC + Bare Module assembling+ Report with links

to Items to Module Assembly sub-Items with link to future tests

exist.

Test IV + Report exist.

Missing: Our Module Item is called “ModuleFEIPrototype”. The PDB structure for production Item “Module” does not exist.

Test definitions, as a consequence:Tables + java applications + Reports for tests.

Data:

23 ModuleFEIPrototype Items with substructures.

Page 7: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 7

23 ModuleFEIPrototype Items:23 ModuleFEIPrototype Items:

Page 8: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 8

Mechanics + Assemblies with Mechanics + Assemblies with ModulesModules

PDB readiness:

Structures are defined. => the Items and Assemblies can be registered at least manually.

Local Support test tables + java applications + Reports exist.

Missing: java application to register Assemblies in the easy way.

To start to think about:Tests for Staves (Bi-staves) and Sectors with Modules on them.

Data:

200 Omegas are registered. 11 TMT-left are registered with CC test results.

Missing (of existing Items):Al tubes, TMT-right,Sector parts.

First Module is mounted on Sector:We need to accelerate… not registered…

Page 9: Pixel Production Database  STATUS P. Netchaeva - INFN Genova 13 February 2003

Pixel Week - Production update - 13 February 2003 - P.Netchaeva INFN GenovaPixel Week - Production update - 13 February 2003 - P.Netchaeva INFN Genova 9

ShipmentsShipmentsPDB readiness:

java applications for:send and receive Wafer (sensor or electronics)send just received Items without changereceive an Assembly with the following update

of all components location

+ Report with links to Shipments exist.

Shipment statistics Report(Items shipped/time) exist.

The activity of the manufacturersseems to be well coveredby persons in charge.

Missing: Send Electronics Wafer with new reticle layout.

Data